LeadinWay Co., Ltd is honored to announce that it has signed a memorandum of understanding (MoU) with Nearfield Instruments B.V., an expert and leading company of Metrology Equipment for Semiconductor Industry based on Scanning Probe Microscopy, to enter into a partnership supporting the sales of Nearfield Instruments’ products in Taiwan R.O.C.

Nearfield Instruments of Rotterdam, The Netherlands develops High-Throughput Scanning Probe Metrology systems that enable direct measurement of Semiconductor manufacturing process control parameters that are either very hard to measure with other techniques or only in a destructive manner or at very low throughput. Nearfield Instruments’ area of focus is semiconductor wafer fabs and includes both Process Window Discovery and Process Window Expansion & Control.

Established in 2002, LeadinWay is a highly regarded marketing/sales/service provider to the Semiconductor, Electrical, Specialty Chemical, and Alternative Energy industries in Taiwan, China, and Southeast Asia.