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Automated High-Throughput 3D Scanning Probe Metrology

NFI delivers daringly innovative metrology solutions to process control challenges in the high-end nano-electronics industry

careers NFI

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Open Vacancies

Nearfield Instruments (NFI) brings together the most creative minds in science and technology to develop a revolutionary high throughput atomic force microscopy system enabling atom-scale resolution 3D metrology at industry-level throughput, based on three pillars.

 

Join our dedicated team in developing and delivering these advanced metrology systems to our customers! We have several exciting and challenging positions available. Interested?

Collaboration Partners

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