Automated High-Throughput 3D Scanning Probe Metrology
NFI delivers daringly innovative metrology solutions to process control challenges in the high-end nano-electronics industry
Nearfield Instruments (NFI) brings together the most creative minds in science and technology to develop a revolutionary high throughput atomic force microscopy system enabling atom-scale resolution 3D metrology at industry-level throughput, based on three pillars.
Join our dedicated team in developing and delivering these advanced metrology systems to our customers! We have several exciting and challenging positions available. Interested?